Satoshi Shirai, Hiromi Ueda, Tomiko Hyodo, Akio Yokoo & Satoru Ikehara, Technical Report of IEICE, SIG-NLC, October 11, 1996

Computer Aided Design of Valency Pattern Pairs for Japanese-to-English Machine Translation

Satoshi SHIRAI^*1, Hiromi UEDA^*2, Tomiko HYODO^*2, Akio YOKOO^*1 and Satoru IKEHARA^*3

^*1NTT Communication Science Laboratories, ^*2NTT Advanced Technology Corporation and ^*3Faculty of Engineering, Tottori University

Abstract

In order to improve the quality of machine translation, the valency pattern method is known to be effective to analyze the meaning relation between verbs and nouns. When making new patterns, we look for pattern pair candidates in example sentences. When adding new pattern pairs to existing patterns, we look for pattern shortages and after adding new patterns we check for inconsistencies between added patterns and existing patterns. We propose a computer support system to perform these processes, and report its effects compared to our traditional support systems.

Key words

machine transIation, Japanese-to-English translation, valency pattern pair, semantic analysis, computer aided design

[ Technical Report of IEICE, NLC96-34, pp.25-30 (October, 1996). ]